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Electro-optic and dielectric characterization of ferroelectric films for high-speed optical waveguide modulators

Author	Advantest Laboratories Co.,Ltd.　Shin Masuda and others
Summary	We investigate the electro-optic properties and high-frequency relative dielectric constants of epitaxially grown lanthanummodified lead zirconate titanate (PLZT) and polycrystalline bariumtitanate (BaTiO3) films in a high-frequency range of up to 40 GHz for designing a high-speedferroelectric thin-film modulator. We also demonstrate a ferroelectric thin-film Mach-Zehnder-type waveguide modulator using the epitaxially grown PLZT film. The use of a composite structure with a low dielectric coefficient substrate and a buffer layer enabled of a ferroelectric thin-filmwaveguide modulator with 40-Gb/s operation. © 2011 American Institute of Physics .
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Real-Time Testing Method for 16 Gbps 4-PAM Signal Interface

Author	ATE Unit Development Group 5th R&D Department FT Technology R&D Section 2 Masahiro Ishida and others
Summary	This paper proposes a method for testing a device with multilevel signal interfaces. This method utilizes multi-level drivers that generate multi-level signals and multi-level comparators that are based on a new concept. The multi-level drivers can test the voltage noise tolerance of a receiver device with multi-level signal interfaces. The multi-level comparators realize real-time functional testing of a multi-level signal with the same number of comparators as a conventional test system, by changing the threshold voltage levels dynamically in response to the expected values of a signal under test. This dynamic threshold comparator concept is suitable for a system testing a high-speed multilevel signal. This method is also scalable for an increase in the number of voltage levels such as 8-PAM and 16-PAM signals. Experimental results are discussed with a prototype circuit that demonstrates the proposed concept applied to a 16 Gbps 4-PAM Test System. Applications of the proposed method are also discussed.
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Analysis Case Using Cross Domain AnalyzerTM

Author	RF Measuring Unit Business DivisionDevelopment Department, 1st Development Minoru Iida and others
Summary	Cross Domain AnalyzerTM U3800 series has the analysis function by the frequency sweep like the conventional Spectrum Analyzer. Furthermore,it has new measurement functions such as the 2-channel Phase Synchronized Measurement. Therefore, the user can analyze the behavior of complicated RF signals, that it is impossible to measureusing conventional instruments, in a multifaceted viewpoint. This report introduces various functions of Cross Domain AnalyzerTM and analysis case using it.
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Teachnology Reports

Visualization of Handler statistics data - The Way of user-oriented GUI -

Author	FA Product Development Department HS Development Section 1 Yuichi Nansai
Summary	Handler Data Visualization Framework (HDVF) is a framework provided to realize the implementation of APIs for writing various kinds of handler data, reading of data, and visualization. This framework allows quick determination of "finding of a problem," "decision making for a solution," and "convergence of the problem" by means of quantifying and visualizing the handler performance. This paper introduces the architecture of this framework and a design concept
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Dedicated Nand Flash Memory Tester Technology With New Concept

Author	ATE System Development Group 8th R&D Department Masahiko Yamabe
Summary	While high growth is expected in the NAND flash memory market, it is necessary to find a solution to the rise in test costs caused by such factors as increased test time due to increased capacity. We have developed a compact tester with low power consumption which achieves higher throughput than before by focusing on the mass production of NAND flash memory chips, devising a tester structure, and using a general-purpose device, and adopting a new Test Processor (TP).
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Development of an ATE Test Cell for At-Speed Characterization and Production Testing

Author	Advantest Europe GmbH José Moreira
Summary	This paper describes the development of a test cell intended for thorough characterization and production testing of a complex multigigabit IC. The objective of this project was to provide a straightforward way to transition from characterization testing to the early production ramp with minimal effort while at the same time not restricting or limiting thorough characterization of the IC. This included providing the flexibility for the Test Engineer being able to use any external measurement instrument required for characterizing the DUT.
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