Probo No.53 Details
Technical Paper
A Review of Combiner/Divider PCB Design Topologies For 5G and WiGig ATE Applications
| Author | Advantest Europe GmbH Giovanni Bianchi others |
|---|---|
| Summary | The new 5G and WiGig standards present new challenges for the test and measurements of integrated circuits for those applications. The main challenges are the very high frequencies (e.g. as high as 44 GHz for 5G and 72 GHz for WiGig) and also the large number of ports (e.g. 16 to as many as 64) due to the use of phase array antennas in these standards and the need to support multiple standards/frequencies in a single IC. Since these integrated circuits are intended for the consumer market, cost of test is a critical factor. This means that for volume production testing, it might be advantageous to combine the multiple RF ports into a single port that can then be measured with a single measurement instrument port. This is sometimes referred to as a "corporate feed" in the automated test equipment (ATE) community. This approach would allow an ATE system with multiple measurement RF ports to test multiple integrated circuits in parallel and in this way reduce to cost of test. This approach is only valid for integrated circuits at wafer level or in packages that have no integrated antennas. For 5G and WiGig applications there are devices that have the phase array antennas integrated for example in the package. In these cases, an over the air (OTA) testing approach is necessary which is not addressed in this paper. |
| Key Words | Not Specified |
A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces
| Author | ATE Business Group Technology Development Group Technology Development Division 5th R&D Department FT Technology R&D Section 2 Kiyotaka Ichiyama others |
|---|---|
| Summary | In recent high-speed data transmissions, a multilevel signaling such as a pulse amplitude modulation (PAM) is adopted instead of binary signaling to enable higher data rate. For testing PAM receivers, stressed testing which utilizes test signal with jitter and noise is very important. This paper introduces a jitter injection module for 4-level PAM (PAM4) signals. It can generate a 52-Gbps PAM4 signal from two 26-Gbps nonreturn-to-zero (NRZ) signals and inject jitter with frequency up to 1 GHz and amplitude up to 100 ps into the PAM4 signal. Experimental results demonstrate injecting of sinusoidal jitter, random jitter and bounded uncorrelated jitter into PAM4 signals. Combining this jitter injection module with an existing ATE provides low cost jitter tolerance testing of high-speed PAM4 signal interfaces. |
| Key Words | high-speed interface testing, pulse amplitude modulation, jitter injection, production testing, ATE |
Magnetocardiography measurements by using active magnetic canceller
| Author | Advantest Laboratories Ltd. Yuji Ogata others |
|---|---|
| Summary | Magnetocardiography (MCG) is effective for diagnosis of disease sites because it can measure heart activity at a high spatial resolution. However, a conventional MCG measurement system should be used inside a magnetically shielded room (MSR) this is costly and restricts measurement place. Therefore, to realize MCG measurement outside an MSR, we developed an active magnetic canceller and signal processing to decrease the influence of environmental magnetic noise. |
| Key Words | Not Specified |
Application
Mass production technology of MEMS sensor with ATE
| Author | A&P Section 2 T2000 SE Department System Solution Division Sales Group Minoru Saito |
|---|---|
| Summary | The test solution with automated test equipment (ATE) for a micro-electro-mechanical systems (MEMS) sensor, which is growing rapidly in the IoT and automotive markets, is introduced in this report. A very difficult measurement is required in the inspection with MEMS sensors. Measurements of current of 10pA or less, capacitances of 10pF or less, and voltage of 100µV or less are in this category. Although external measuring devices are currently used for such measurements, these have problems in that GPIB communication time is a bottleneck to make the measurements time-consuming, and to make mass production efficiency poor. For these issues, this report introduces the technology of highly accurate and speedy inspection without using measuring devices, with the examples of an acceleration sensor and pressure sensor. |
| Key Words | Not Specified |