No.38 (May, 2012)
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* Positions and job titles of contributors are as of the time of writing and are not necessarily current.
Technical Paper
| Title/Author |
|---|
| Electro-optic and dielectric characterization of ferroelectric films for high-speed optical waveguide modulators Advantest Laboratories Co.,Ltd. Shin Masuda and others |
| Real-Time Testing Method for 16 Gbps 4-PAM Signal Interface Advantest Laboratories Co.,Ltd. Shin Masuda and others |
Technical Description
| Title/Author |
|---|
| Visualization of Handler statistics data - The Way of user-oriented GUI - FA Product Development Department HS Development Section 1 Yuichi Nansai |
| Dedicated Nand Flash Memory Tester Technology With New Concept ATE System Development Group 8th R&D Department Masahiko Yamabe |
| Development of an ATE Test Cell for At-Speed Characterization and Production Testing Advantest Europe GmbH José Moreira |
Application
| Title/Author |
|---|
| Analysis Case Using Cross Domain AnalyzerTM RF Measuring Unit Business DivisionDevelopment Department, 1st Development Minoru Iida and others |