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Course	The Fundamental of IC Test	Duration	3 days
Target Audience	Fresh people to ATE industry
Prerequisite	None
Training Objectives	The training provides the foundation to all aspects of IC test
Training Objectives	After completion, you will be familiar with the following - ATE industry introduction and ATE system architecture - Introduction of classical DC test items (continuity, leakage, output DC, static IDD, dynamic IDD and etc.) and test methodologies - Introduction of classical Functional and AC test items (continuity, output DC, propagation delay and etc.) and test methodologies - Introduction of basic ATE tools for characterization, yield analysis and datalog (linearity/binary search, shmoo, error map and etc.)

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