Probo No.45 Details
Technical Paper
Development of optical functional devices using epitaxially grown lanthanum-modified lead zirconate titanate films
| Author | Advantest Laboratories, Ltd., O Project Takashi Kawasaki others |
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| Summary | Various optical components, such as light sources, optical modulators, switches and attenuators etc, are utilized in the optical test system for testing of LSIs with high-speed optical transceivers. These devices should be integrated into a single substrate to reduce mounting areas, optical connection losses and cost. We present here micro waveguide type optical control devices using epitaxially grown lanthanum-modified lead zirconate titanate (PLZT) thin film for integrated optical circuit. As a result, we have designed bias free optical high speed modulator, 1×4 optical splitter, and variable optical attenuator. And we also show the possibility of spot size converter using PLZT thin film. |
| Key Words | PLZT, Optical Modulator, Optical Splitter, VOA, SSC |
An ATE System for Testing 2.4-GHz RF Digital Communication Devices with QAM Signal Interfaces
| Author | Technology Development Group 5th R&D Department FT Technology R&D Section 2 Kiyotaka Ichiyama others |
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| Summary | Recently, there is an increasing need for methods of functionally testing RF devices to provide lower cost alternatives to testing RF communication systems. This paper proposes an ATE system for testing RF devices with QAM signal interfaces. The system utilizes a concept of direct modulation/demodulation with multilevel drivers and multi-level comparators. The multi-level drivers can directly generate the 4-QAM and 16-QAM signals. The multilevel comparators can directly compare the baseband data with its expected data. The multi-level comparators are based on the dynamic threshold concept which changes the threshold voltage levels dynamically in response to the expected values of a signal under test. This architecture is suitable for a test system which is required to test many kinds of signals flexibly. Experimental results are discussed with a prototype circuit that demonstrates the proposed concept applied to testing of a 2.4 GHz 16-QAM signal. |
| Key Words | Not Specified |
Application
Development of high accuracy vision alignment function for the test handler
| Author | FA Division FA Product Development Department Advanced Technology Development Section Masataka Onozawa others |
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| Summary | Recently, smartphones are getting smaller/thinner and the devices that are used in smartphones are also getting smaller. Related to this, the pin pitch of device is going to shrink. To test these fine pitch devices, existing mechanical alignment method has concerns about contact positioning accuracy to the test socket. This contact accuracy impacts the yield loss. To increase contact accuracy significantly, we have developed device terminal (solder ball) oriented high accuracy vision alignment test handler. |
| Key Words | Not Specified |
Test Program Generation Environment for Analog Device Test on T2000.
| Author | SoC Application Engineering T2000 AE Akira Takahashi others |
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| Summary | High integration and high functionality of semiconductor are developed in recent years, and test item for device characterization tends to be increased. On the other hand, reduction in development time and period is necessary for the market development in early stage of semiconductor product. So Advantest offers a solution to reduce the development time of semiconductor test program by using Automatic test Program Generator (APG). This paper explains key functions of APG, and introduces its effects. |
| Key Words | APG、TPC、TPE、試験プログラム開発時間の短縮 |