Probo No.50 Details
Technical Paper
Photonic Integrated Circuit Using Lanthanum-Modified Lead Zirconate Titanate Thin Films
| Author | Advantest Laboratories Ltd. Shunsuke Abe others |
|---|---|
| Summary | We fabricated a novel photonic integrated circuit using a lanthanum-modified lead zirconate titanate thin film. An optical modulator operating up to 50 Gb/s and a variable attenuator were successfully integrated on the PLZT thin film. |
| Key Words | Not Specified |
Lensless high-resolution photoacoustic imaging scanner for in vivo skin imaging
| Author | STO Project 2nd R&D Group New Concept Product Initiative Taiichiro Ida others |
|---|---|
| Summary | We previously launched a high-resolution photoacoustic (PA) imaging scanner based on a unique lensless design for in vivo skin imaging. The design, imaging algorithm and characteristics of the system are described in this paper. Neither an optical lens nor an acoustic lens is used in the system. In the imaging head, four sensor elements are arranged quadrilaterally, and by checking the phase differences for PA waves detected with these four sensors, a set of PA signals only originating from a chromophore located on the sensor center axis is extracted for constructing an image. A phantom study using a carbon fiber showed a depth-independent horizontal resolution of 84.0±3.5µm, and the scan direction-dependent variation of PA signals was about ±20%. We then performed imaging of vasculature phantoms: patterns of red ink lines with widths of 100 µm or 200 µm formed in an acrylic block co-polymer. The patterns were visualized with high contrast, showing the capability for imaging arterioles and venues in the skin. Vasculatures in rat burn models and healthy human skin were also clearly visualized in vivo. |
| Key Words | Photoacoustic, in vivo imaging, lensless, phantom, burn depth assessment |
Delay Fault Testing Using CloudTesting™ Services
| Author | Advantest America Inc A.T.Sivaram others |
|---|---|
| Summary | Nanometer technology has led to a drastic increase in operational frequency of semiconductor integrated circuits (ICs). Consequently, the performance of circuit becomes more vulnerable to delay variation. Ordinarily testing delay defects requires that the test vectors be applied to the circuit at its intended operating speed. However since high speed testers require capital investments testing for delay defects on a low cost/low speed tester requires special test application if existing test generation strategies are to be used. In this paper, we describe how a new innovative service oriented test solution whose main goal is to reduce test development, debug and new silicon verification costs, is useful for testing delay faults in a design verification environment. |
| Key Words | Not Specified |
Application
A multiple simultaneous measurement technique for UHF tag RF I/F using a digital module
| Author | SoC SE1 1st SoC System Engineering System Solution Division Sales Group Kazuhiro Iezumi others |
|---|---|
| Summary | The market for ultra high frequency (UHF) band radio frequency identification (RFID) is expected to grow rapidly. The authors have developed a low-cost test solution for UHF band RFID devices by using the "T2000 8-Gbps digital module" (8GDM). Based on a comprehensive examination, reduced cost was achieved in all areas from hardware to system operation. Details of the test system are explained while presenting examples of the main cost reductions. |
| Key Words | RFID, UHF, digital module, multiple simultaneous measurement, SWR |
Proposal for adjustment/inspection of current sensors using an EVA100 magnetism application system
| Author | ADS Marketing and Business Development Department Marketing and Business Development Division Sales Group Shigeo Nakamura others |
|---|---|
| Summary | This paper presents a technique for current sensor adjustment/inspection that uses magnetism application instead of actually applying a large current. The technique is for use in the adjustment/testing process for automotive current sensors requiring high reliability. While using an electromagnet, for which highaccuracy control is difficult, as the magnetism application technique, this method achieves a magnetism setting accuracy of ±0.1%, and a 72% reduction in magnetism settling time compared to conventional techniques. This paper reports on general issues with the magnetism application system, the method of realization, achieved magnetism accuracy, and time reduction method. |
| Key Words | Not Specified |