Probo No.60 Details
Technical Paper
Separation of signal and environmental magnetic noise using independent component analysis
| Author | Advantest Laboratories Ltd. Kenji Yonegaki others |
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| Summary | In recent years, the demand for magnetic measurement has been increasing in a wide range of fields such as biomedicine, structural inspection, food production, and resource exploration. However, it is generally difficult to make measurements due to the simultaneous presence of magnetic noise in the surrounding area as well as the magnetic signal produced by the measurement target. In order to deal with this problem, we examined the separation of interest signals and environmental magnetic noise from the data acquired by the magnetic sensor array using independent component analysis. In this paper, we report on the evaluation of the signal separation performance of independent component analysis in magnetic measurement. |
| Key Words | independent component analysis, environment magnetic noise, sensor array |
Breakthrough for Test Cost Reduction on MicroLED Device with Electric-Luminescence and Electrical Test Embedded Solution
| Author | Applied Research & Venture Team (ARTeam) Japan Lab Kotaro Hasegawa others |
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| Summary | To launch up Micro-LED display, the biggest challenge is cost reduction, With the urgent needs to reduce test costs, most critical issues is parallelizing electroluminescence (EL) test. In this paper, we propose super cost-effective test methods (PEMP™) embedding EL and electrical test and report its effectiveness and application results. |
| Key Words | Micro-LED, Mass Production, High Throughput, test efficiency |
Technical Description
Development of control system “HC-X” for inteXcell(MC5041)
| Author | DH Business Group, DH Development Division, DT Development Department, Common Technology Development Section Takuro Ashizawa others |
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| Summary | The next-generation handling part has multiple Test Cell and device transfer mechanisms in one system, and maximizes test efficiency by Test Cell configuration which matches customer test requirements. Therefore, the control system with unit scalability is required. We developed the communication board to consolidate multiple networks into one network and mounted it on each Unit. That can make automatic hardware configuration detection and unit-by-unit diagnosis, and provide Test Cell with scalability and productivity. |
| Key Words | Not Specified |
Application
Functional HSIO-Scan and SW-based functional test enabled by V93000 Link Scale™
| Author | Sales Group, System Solution Division, V93000 SAE Department COE Takashi Iino others |
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| Summary | This article introduces Functional HSIO-Scan testing and SWbased functional testing enabled by the V93000 Link Scale, a completely new concept in high-speed digital cards. The V93000 Link Scale utilizes USB and PCI Express (PCIe) which are high-speed interfaces widely used in SoC devices, it expands the conventional scan test method and prevent the increase of mass production test costs. It also provides an environment for device validation and testing based on the concept of SW-based functional test. This article describes the test challenges and solutions for these advanced SoC devices and the practicality of the V93000 Link Scale. |
| Key Words | Scan test, high speed interface (HSIO), system level test (SLT), design verification (DV) |