No.43 (January, 2015)
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Technical Paper
| Title/Author |
|---|
| A 10MHz-12GHz low-distortion high-speed SP4T switch using GaN HEMTs with oxynitride TaON passivation Advantest Laboratories Co.,Ltd. Shin Masuda and others |
| Development DC test technology with high additional value adopting digital controlled technology Technology Development Group 3rd R&D Department DC Core Engineering Section Takahiko Shimizu |
| Static/Dynamic Characteristics Testing for capacitive Acceleration Sensor MEMS ASD Test & Measurement System Business Group Shinichi Kimura |
| Advanced Method to Refine Waveform Smeared by Jitter in Waveform Sampler Measurement Former System Solution Group Hideo Okawara |
Application
| Title/Author |
|---|
| High-precision measurement technology for the terahertz wave power Terahertz System Business Division System R&D Department Technology Development and SE Section Shigeki Nishina |
