T2000

While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. Advantest's T2000 is ideal for testing these devices.

Time to Market Reduction - Multi-Session

The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000, multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work simultaneously, contributing to both engineering cost savings and TTM reduction. In addition, eight people can develop separate functions for the same device concurrently, which greatly shortens development times.

Best-In-Class Parallel Test Efficiency - Multi-Site Controller

As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and test times in general tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology that completely eliminates overhead.

Test Time Reduction - Concurrent Test

The T2000 supports concurrent test functionality which can execute complex device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times.

Test Cost Reduction

With up to 8,192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.

T2000 Product Lineup

Software

Windows Based Operating System. Easy to Use. Easy to Customize.
Rapid Development Kit (RDK) Environment: Easy Coding, High Code Reusability, and Fast Debug.
Versatile Offline Environment: Thorough T2000 System Software Emulator.
Abundant Tester Tools: Wave Tool (Logic Analyzer, Oscilloscope), Shmoo, Pattern Editor, etc.
Instrument Slicing, Test Condition Runtime Optimizer, Multi-session, Concurrent Test Flows.

SoC Test Solution

High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today's complex consumer devices.

Achieve feature-rich capabilities with high precision

Analog modules provide broad coverage.

In the ever-evolving digital consumer market, devices are becoming more sophisticated and diversified in terms of functionality with:

Multi-Time Domain functionality for testing several frequency domains simultaneously.
1GDM / 1.6GDM realizes low cost of test by high parallel testing.
DSP192A module supports 96-ch device power supply by high density mounting.
Analog modules (BBWGD/GPWGD) full-spec test, covering high-performance audio to video and baseband.
PMU32E module capable of handling a broad spectrum of precision test including ADC/DAC linearity.
8GDM corresponds to high-speed interface device testing.

Flexibly combined with these test modules, T2000 provides customers with an optimized test solution for consumer devices.

Wireless Test Solution

Next-Generation Solutions for Wireless Communication Systems

Fully Integrated Single Module "WLS32-A" with 4 Unique RF Vector Signal Generators and Analyzers

High-performance VSG and VSA instrumentations supporting complex modulation densities up to 80MHz bandwidth
Fast test times achieved with fast settling synthesizer switching
Highest industry RF port density (32 per module and scalable to 128) for today's and tomorrow's multi-DUT MIMO and transceiver applications, which supports high parallel testing
High-speed & high carrier to noise ratio synthesizer modes to address production and characterization solutions
Built-in low-noise, low-jitter programmable reference signal generator for reference signal input
Internal highly linear 2-tone combiner to produce > +28dBm (@2.2GHz, -12dBm) output IP3 to device
Lowest COT achieved with quad-DUT native capability (parallel source and measure)

Integrated Power Device Test Solution

We provide solutions for high-performance, high-throughput testing of devices for automotive, industrial and power management applications.

Setting a New Standard

High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.
Low cost of test with high parallelism.
Increased throughput with pattern-controlled test conditions.
Enhanced test efficiency using per-channel time measurements.
Simple load board Design by Cross function port and matrix functionality.
Best-in-class performance, including fast range switching hardware, fast switching relays and concurrent hardware operation.
Simplified coding enabled by the rapid development kit (RDK) software package, which provides a user-friendly environment for developing reusable code and implementing fast debugging.
Wide coverage for testing on the same platform, from low-voltage communication PMICs to high-voltage automotive ASSPs.

Optimized Modules for Power Mixed Signal Test

CMOS Image Sensor Test Solution

We provide a test solution that minimizes test cost, by flexibly supporting measurement of the most advanced CMOS image sensors with a high-speed interface.

Flexible support for multifunction image sensors

CMOS image sensors have a variety of built-in functions including AD/DA and logic circuits.
By combining measurement modules, The T2000 can achieve a scalable system configuration with the functions required for image sensor testing.

High speed Image capture up to 4.8Gbps

Equipped with a high-speed image-capture interface that supports a variety of CMOS image sensors, providing higher precision, higher sensitivity, and greater speed for products that utilize such sensors, including mobile, security cameras, and automotive/industrial cameras.
Dual bank high-capacity capture memory stores data and transfers data to the IP Engine at the same time, minimizing the test time.

Differential Input
MIPI D-PHY V2.1 : 4.8Gbps
MIPI C-PHY V1.2 : 3.5Gsps
Capture Memory : 1,024M pixel x 2bank
Available to store max. 64,000 frames of the image data to the memory

It can capture CIS image data quickly and efficiently when used in combination with our high-speed image processor engine IPE3 (Image Processor Engine 3).

Test cost reduction by Maximum 64 DUT Parallel testing

The T2000 can measure multiple DUTs simultaneously, improving the productivity of image sensor chips and reducing test costs. With a wide user area and a light source with an enlarged irradiation area of 160 mm by 150 mm, it can perform parallel measurement of up to 64 DUTs.

T2000 module configuration for CMOS image sensor testing

Scalable System Configuration

	R&D, Small Lot Production	Mid Volume Production	High Volume Mass Production

Parallel Test	16	32	64
Main Frame	LSMF	LSMF	LSMF+EXMF
Test Head	13 slot	46 slot	46 slot

Digital

1GDM/1.6GDM T2000 256-ch 1 Gbps Digital Module/ T2000 256-ch 1.6 Gbps Digital Module

Digital module operating at 1.6 Gbps max. and equipped with up to 256 I/O channels.
It is equipped with SCAN, ALPG, or other pattern generators and per-pin PMU, and it has standard functions that fulfill the test requirements for various devices such as MPU, FPGA, and MCU.

2GDME T2000 256-ch Enhanced 2 Gbps Digital Module

Digital module operating at 2 Gbps max. and equipped with up to 256 I/O channels.
It also supports voltage output testing for automotives.

500MDM T2000 128-ch 500 Mbps Digital Module

Digital module for Air cooling that is operating at 500 Mbps max. and equipped with up to 128 I/O channels.
It has the functions equivalent to those of the 1GDM module. A system that takes less space can be configured when used in combination with T2000 AiR.

8GDM T2000 8 Gbps Digital Module

High-speed testing is available at the maximum operation speed of 8 Gbps, and each module is equipped with up to 96 I/O channels.
It enables effective testing of serial and parallel interfaces.

DPS / VI

DPS32A T2000 32-ch Device Power Supply 32A

The DPS32A module is used to supply power to the device that is being tested.
It is equipped with 32 channels. Each channel can supply a maximum current of 1A.
A system that takes less space can be configured when used in combination with T2000 AiR.

DPS90A T2000 64-ch Device Power Supply 90A

The DPS90A module is used to supply power to the device that is being tested.
It is equipped with the 2A_Function and 0.8A_Function, which can supply a maximum current of 2A and 0.8A per channel, respectively.

DPS192A T2000 96-ch Device Power Supply 192A

The DPS192A module is used to supply power to the device that is being tested.
It is equipped with the 3A_function, 2A_function, and 1A_function, which have different maximum current supply capabilities, making it possible to supply power more efficiently to the device that is being tested.

DPS150AE T2000 Enhanced Device Power Supply 150A

The DPS150AE module is used to supply power to the device that is being tested.
It is equipped with the HC_Function and LC_Function, which can supply a maximum current of 16A and 2.66A per channel, respectively.
Parallel operation makes it possible to supply current at 1000A and higher.

PMU32E T2000 32-ch Enhanced Multi-purpose Parametric Measurement Unit

The PMU32E module is equipped with the function to generate voltage and measure current, as well as the function to generate current and measure voltage. It is used to perform DC parametric tests and DC linearity tests for AD and DA converters.

Analog / RF

GPWGD (HR) T2000 32-ch General Purpose Arbitrary Waveform Generator/Digitizer

The GPWGD module is composed of the general-purpose arbitrary waveform generator, general-purpose waveform digitizer, reference voltage generator, and parametric measurement unit, and supports analog measurements for audio and video devices, etc.
It has a high dynamic range property, which is required for digital audio devices.

BBWGD T2000 16-ch Baseband Arbitrary Waveform Generator/Digitizer

The BBWGD module is composed of the baseband arbitrary waveform generator, baseband waveform digitizer, clock generator, and parametric measurement unit; and supports high-precision measurements of baseband signals.

WLS32-A T2000 12 GHz Wideband Signal Generator/Measurement Module

The WLS32-A module is equipped with an RF signal generation function, analysis function, measurement function, and reference clock signal generation function; and supports RF measurements for mobile phones, wireless LAN, etc.

Automotive / PMIC

MMXHE T2000 64-out Enhanced, High Voltage, and Multi Functional Mixed Module

The Multi Function Mixed High Voltage (MMXHE) module is a multi-function mixed signal module that has 32 digital channels with high voltage magnitude and 32 parametric measurement unit (PMU) channels. Those digital channels and PMU channels can switch I/O alternatively. Each PMU channel is equipped with an arbitrary waveform generator (AWG), which allows channel-to-channel synchronization and a digitizer (DGT). In addition, the module enables time measurement per pin from various resources and also has a differential voltmeter, which can access all channels, and an IDDQ test function.

MFHPE T2000 36-out Enhanced and Multi Functional Floating High Power Module

The Multi Function Floating High Power (MFHPE) module is a multi-function power mixed signal module that has 18 channels of floating VI resources. It can be used as a device power supply or load resource based on the pulse and static conditions. By connecting multiple channels in series or in parallel, the requirements for higher voltage and higher current capacity can be fulfilled. In addition, each VI resource is equipped with an arbitrary waveform generator (AWG), which is used for modulation in the voltage or current mode and a digitizer (DGT), which is used for the simultaneous measurement of voltage and current. It also enables time measurement per channel from various resources.

MPCM T2000 72-out Multi Functional and Cross Point Matrix Module

The Multi-function Power Cross Point Matrix (MPCM) module allows the MFHPE channel to be connected to multiple DUT pins. By using its dedicated GND, floating measurement and ground reference measurement can be performed in the same application. In addition, the parametric measurement unit (PMU) makes it possible to conduct a parallel contact test, kelvin check, and parametric test.

Image Sensor

4.8GICAP T2000 4.8 Gbps Image Capture Module

The 4.8G ICAP module is used to test the CMOS image sensors. The module can capture image data that complies with the MIPI standards D-PHY Ver. 2.1 and C-PHY Ver. 1.2 at high speed.
The D-PHY has one pair of clocks and four pairs of data per channel, and can capture images at a data rate of 100 Mbps to 4.8 Gbps.
The C-PHY has a trio of three wires per channel and can capture images at a data rate of 800 Msps to 3.5 Gsps. Each module can measure up to four devices simultaneously.
In addition, the PMU can interrupt each input line, and the DC voltage can be measured.

The T2000 makes it possible to have a scalable system configuration ranging from an air cooling system with 9 slots to a liquid cooling system with 52 slots and up to 8,192 channels.
We provide compact solutions with reduced initial investment for development and small lot productions and high-efficiency multiple-DUT parallel measurement solutions for mass productions. With the T2000, we can recommend the optimal configuration for your measurement needs.