No.41 (March, 2014)
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* Author positions and job titles are valid at time of submissions and not necessarily current.
Technical Paper
| Title/Author |
|---|
| Power Integrity Control of ATE for Emulating Power Supply Fluctuations on Customer Environment Technology Development Group 5th R&D Department FT Technology R&D Section 2 Takashi Kusaka others |
| Real-time photoacoustic imaging system for clinical burn diagnosis New Concept Product STeLS Project Taiichiro Ida others |
| Low Cost Test Method for RF Communication Devices Using Equivalent EVM Approach Technology Development Group 10th R&D Department Algorithm R&D Section Koji Asami others |
| A slim column cell of 12nm resolution for wider application of E-beam lithography Nanotechnology Business Division Akio Yamada others |
| High aspect wiring by the inkjet Advantest Laboratories Co., Ltd. Takeshi Tanaka others |
Technical Description
| Title/Author |
|---|
| Test technology of CMOS image sensor device Software Development Group 2nd Software Department Hiroshi Nagasawa |
Application
| Title/Author |
|---|
| Multi-Domain Test - A New Test Strategy to Reduce the Cost of Test System Solution Group SoC Solution COE Satoshi Nomura |
| Tablet coating evaluation technique and analysis examples in the pharmaceutical industry using terahertz wave New Concept Product Initiative TAS Project TSD Section Naomi Sato Other |