No.49 (February, 2018)
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* Author positions and job titles are valid at time of submissions and not necessarily current.
Technical Paper
| Title/Author |
|---|
| A New Method for Measuring Alias-Free Aperture Jitter in an ADC Output Advantest Laboratories Ltd. Takahiro Yamaguchi others |
| Fundamentals of quadrature modulation-demodulation and signal analysis Technology Development Group 10th R&D Department Algorithm R&D Section Koji Asami |
| A Jitter Separation and BER Estimation Method for Asymmetric Total Jitter Distributions Technology Development Group 5th R&D Department FT Technology R&D Section 2 Kiyotaka Ichiyama others |
Application
| Title/Author |
|---|
| Jitter Measurement Using a V93000 Time Measurement Unit (TMU) and Taking into Account the Jitter Transfer Function Sales Group System Solution Division 2nd SoC System Engineering SoC SE3 Takashi Iino others |
| High accuracy EPE measurement & Lithography Simulation capability for ILT mask Nanotechnology Business Group Second Product Development Department Software Development Section Satoru Kondo others |