No.39 (February, 2013)
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* Positions and job titles of contributors are as of the time of writing and are not necessarily current.
Technical Paper
Title/Author |
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VPCS "Vacuum probe contact system" New Concept Product Initiative NPX ProjectTakashi Naito others |
Elegant Construction of SSC Implemented Signal by AWG And Organized Under-sampling of Wideband Signal System Solution Group SoC System Engineering COE(Center Of Expertise) Hideo Okawara |
Technical Description
Title/Author |
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Development of termination voltage amplifier for 10Gbps CML PE-Driver Technology Development Group 3rd R&D Department Masashi Watanabe and others |
Development of wide band range, High-density and High-speed Transmission Connector for HIFIX DI Business Division DI R&D Department Hirotaka Wagata |
Low COT Tester Technology for Memory Core Testing Memory Test Business Group 7th R&D Department Masaru Doi |
Application
Title/Author |
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Test technology of IGBT on T2000 System Solution Group SoC System Engineering Solution Development Hideo Yasuda |
The performance of T5511 Timing-Training hardware System Solution Group Memory System Engineering Global Operation Yuiko Ushirogi |
Test Technology Enabling Multiple-Device Parallel Testing of Motion Sensors Advantest Kyushu Systems Co., Ltd. Junichi Hikosaka and others |