No.44 (Aug, 2015) No.44 (Aug, 2015)

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Technical Paper

Title/Author
Statistical Silicon Results of Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills
Technology Development Group 5th R&D Department FT Technology R&D Section 2 Takashi Kusaka others
Three dimensional profile measurement using multi-channel detector MVM-SEM
Nanotechnology Business Division Second Product Development Department Software Development Section Makoto Yoshikawa others
An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution
Advantest Europe GmbH 93k HW BBN José Moreira others

Application

Title/Author
Embodiment of Efficient Test Program Development Environment in T2000
Software Development Group 5th Software Department SoC Software Section 1 Hironori Maeda others
Development of Device Interface and Probe Card for Image Sensor Tests to achieve 3Gbps Data Transmission
FormFactor Inc, Special Product Group Minoru Mikami Others