No.42 (July, 2014)
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Technical Paper
| Title/Author |
|---|
| 30-Gb/s Optical and Electrical Test Solution for High-Volume Testing Technology Development Group 5th R&D Department Daisuke Watanabe others |
| A New Method for Off-Chip or On-Die Timing Noise Measurement Advantest Laboratories, Ltd. Takahiro Yamaguchi others |
| Time to Market Reduction from Pre-/Post-Silicon Verification to Production on ATE SoC Test Business Group Business Development Department Atsuo Sawara |
Technical Description
| Title/Author |
|---|
| Why Next-Generation NAND Flash Requires a Dedicated Test Solution Advantest America, Inc. Product Marketing Ken Hanh Lai |