No.44 (Aug, 2015)
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Technical Paper
| Title/Author |
|---|
| Statistical Silicon Results of Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills Technology Development Group 5th R&D Department FT Technology R&D Section 2 Takashi Kusaka others |
| Three dimensional profile measurement using multi-channel detector MVM-SEM Nanotechnology Business Division Second Product Development Department Software Development Section Makoto Yoshikawa others |
| An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution Advantest Europe GmbH 93k HW BBN José Moreira others |
Application
| Title/Author |
|---|
| Embodiment of Efficient Test Program Development Environment in T2000 Software Development Group 5th Software Department SoC Software Section 1 Hironori Maeda others |
| Development of Device Interface and Probe Card for Image Sensor Tests to achieve 3Gbps Data Transmission FormFactor Inc, Special Product Group Minoru Mikami Others |