No.51 (January, 2019)
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* Author positions and job titles are valid at time of submissions and not necessarily current.
Technical Paper
| Title/Author |
|---|
| Drain-induced barrier lowering in normally-off AlGaN-GaN MOSFETs with singleor double-recess overlapped gate Advantest Laboratories Ltd. Taku Sato others |
| A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces FT Technology R&D Section 2, 5th R&D Department, Technology Development, Business Promotion Group Kiyotaka Ichiyama others |
| Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system Memory SE1, Memory System Engineering, System Solution Division, Sales Group Ryo Tamura others |
Application
| Title/Author |
|---|
| New Thermal Technology for a New Burn-in Test System CHL Group, Mechanical Design Department, Mechanical Engineering Division, Production Group Tsuyoshi Yamashita |
| T2000 IPS + GPWGD: a Measurement Technique with Ultra-High Dynamic Range for Hi-Res Audio Solution Section 1, Solution Department, System Planning Division, T2000 Business Unit, ATE Business Group Takahiro Nakajima others |