No.39 (February, 2013)
Please first register from below in order to view Probo article online.
* Positions and job titles of contributors are as of the time of writing and are not necessarily current.
Technical Paper
| Title/Author |
|---|
| VPCS "Vacuum probe contact system" New Concept Product Initiative NPX ProjectTakashi Naito others |
| Elegant Construction of SSC Implemented Signal by AWG And Organized Under-sampling of Wideband Signal System Solution Group SoC System Engineering COE(Center Of Expertise) Hideo Okawara |
Technical Description
| Title/Author |
|---|
| Development of termination voltage amplifier for 10Gbps CML PE-Driver Technology Development Group 3rd R&D Department Masashi Watanabe and others |
| Development of wide band range, High-density and High-speed Transmission Connector for HIFIX DI Business Division DI R&D Department Hirotaka Wagata |
| Low COT Tester Technology for Memory Core Testing Memory Test Business Group 7th R&D Department Masaru Doi |
Application
| Title/Author |
|---|
| Test technology of IGBT on T2000 System Solution Group SoC System Engineering Solution Development Hideo Yasuda |
| The performance of T5511 Timing-Training hardware System Solution Group Memory System Engineering Global Operation Yuiko Ushirogi |
| Test Technology Enabling Multiple-Device Parallel Testing of Motion Sensors Advantest Kyushu Systems Co., Ltd. Junichi Hikosaka and others |