No.39 (February, 2013) No.39 (February, 2013)

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* Positions and job titles of contributors are as of the time of writing and are not necessarily current.

Technical Paper

VPCS "Vacuum probe contact system"
New Concept Product Initiative NPX ProjectTakashi Naito others
Elegant Construction of SSC Implemented Signal by AWG And Organized Under-sampling of Wideband Signal
System Solution Group SoC System Engineering COE(Center Of Expertise) Hideo Okawara

Technical Description

Development of termination voltage amplifier for 10Gbps CML PE-Driver
Technology Development Group 3rd R&D Department Masashi Watanabe and others
Development of wide band range, High-density and High-speed Transmission Connector for HIFIX
DI Business Division DI R&D Department Hirotaka Wagata
Low COT Tester Technology for Memory Core Testing
Memory Test Business Group 7th R&D Department Masaru Doi


Test technology of IGBT on T2000
System Solution Group SoC System Engineering Solution Development Hideo Yasuda
The performance of T5511 Timing-Training hardware
System Solution Group Memory System Engineering Global Operation Yuiko Ushirogi
Test Technology Enabling Multiple-Device Parallel Testing of Motion Sensors
Advantest Kyushu Systems Co., Ltd. Junichi Hikosaka and others