No.41 (March, 2014) No.41 (March, 2014)

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* Positions and job titles of contributors are as of the time of writing and are not necessarily current.

Technical Paper

Power Integrity Control of ATE for Emulating Power Supply Fluctuations on Customer Environment
Technology Development Group 5th R&D Department FT Technology R&D Section 2 Takashi Kusaka others
Real-time photoacoustic imaging system for clinical burn diagnosis
New Concept Product STeLS Project Taiichiro Ida others
Low Cost Test Method for RF Communication Devices Using Equivalent EVM Approach
Technology Development Group 10th R&D Department Algorithm R&D Section Koji Asami others
A slim column cell of 12nm resolution for wider application of E-beam lithography
Nanotechnology Business Division Akio Yamada others
High aspect wiring by the inkjet
Advantest Laboratories Co., Ltd. Takeshi Tanaka others

Technical Description

Test technology of CMOS image sensor device
Software Development Group 2nd Software Department Hiroshi Nagasawa


Multi-Domain Test - A New Test Strategy to Reduce the Cost of Test
System Solution Group SoC Solution COE Satoshi Nomura
Tablet coating evaluation technique and analysis examples in the pharmaceutical industry using terahertz wave
New Concept Product Initiative TAS Project TSD Section Naomi Sato Other