No.42 (July, 2014) No.42 (July, 2014)

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Technical Paper

30-Gb/s Optical and Electrical Test Solution for High-Volume Testing
Technology Development Group 5th R&D Department Daisuke Watanabe others
A New Method for Off-Chip or On-Die Timing Noise Measurement
Advantest Laboratories, Ltd. Takahiro Yamaguchi others
Time to Market Reduction from Pre-/Post-Silicon Verification to Production on ATE
SoC Test Business Group Business Development Department Atsuo Sawara

Technical Description

Why Next-Generation NAND Flash Requires a Dedicated Test Solution
Advantest America, Inc. Product Marketing Ken Hanh Lai