No.44 (August, 2015) No.44 (August, 2015)

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Technical Paper

Statistical Silicon Results of Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills
Technology Development Group 5th R&D Department FT Technology R&D Section 2 Takashi Kusaka others
Three dimensional profile measurement using multi-channel detector MVM-SEM
Nanotechnology Business Division Second Product Development Department Software Development Section Makoto Yoshikawa others
An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution
Advantest Europe GmbH 93k HW BBN José Moreira others


Embodiment of Efficient Test Program Development Environment in T2000
Software Development Group 5th Software Department SoC Software Section 1 Hironori Maeda others
Development of Device Interface and Probe Card for Image Sensor Tests to achieve 3Gbps Data Transmission
FormFactor Inc, Special Product Group Minoru Mikami Others