No.47 (Jan, 2017) No.47 (Jan, 2017)
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* Author positions and job titles are valid at time of submissions and not necessarily current.
| Known-Good-Die Test Methods for Large, Thin, High-Power Digital Devices |
Advantest, Inc. San Jose, CA, USA Dave Armstrong others
| Modeling of contact resistance at very small contact point |
Advantest Laboratories Ltd. Takeshi Tanaka others
| ADC Linearity Measurement by Using Servo Method on the EVA100 |
ASD Test & Measurement System Business Group ASD Measurement System R&D Department Application R&D Section Hiroaki Kato
| High Speed and high precision ADC tests using the High Frequency AWG/DGT module of the EVA100 test system |
Technology Development Group 9th R&D Department Yasuhide Kuramochi other
| High-Density LSI Failure Analysis Technology using an Ultra-High Resolution TDR System |
Terahertz System Business Division System R&D Department System R&D Section Masaichi Hashimoto other