No.52 (July, 2019) No.52 (July, 2019)

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Technical Paper

High-resolution Time-domain Reflectometry Analysis in Back-end-of-line (BEOL) by Recursive Circuit Modelling
Advantest (Singapore) Pte .Ltd. Marketing & New Product Department Yang Shang others

Technical Description

Development of high-voltage, high-current floating module with a maximum of 320 V and 18 channels
Business Promotion Group Technology Development Division 8th R&D Department DC R&D Section 1 Shigeyuki Takeda others


Test cell solution for reducing thermal spikes in semiconductor device testing
Sales Group System Solution Division 2nd SoC System Engineering SoC SE3 Takatoshi Yoshino others
Verizon 5G: Test challenges for next generation of mmWave communications using V93000 WaveScale RF
Advantest America, Inc. Max Seminario others
Test Time Analysis & Optimization on SmarTest8
Advantest China Co., Ltd. ADVANTEST Business Development&Center of Expertise, Asia Zexin Yan others