No.58 (June, 2022) No.58 (June, 2022)

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* Author positions and job titles are valid at time of submissions and not necessarily current.

Technical Paper

Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry
Advantest (Singapore) Pte. Ltd Sales & Marketing Department Yang Shang others
GaN 8Gbps High-Speed Relay MMIC for Automated Test Equipment
Advantest Laboratories Co., Ltd. Satoshi Koyama others

Technical Description

The development of front-end module for 5G millimeter-wave device testing
MMW R&D Section, 9th R&D Department, Technology Development Division, Technology Development Group, ATE Business Group Takahiro Kudo others


Development / mass production TAT shortening method through emulation of image sensor device
CIS Section, T2000 SE Department, System Solution Division, Sales Group Takehisa Yoda others