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* Author positions and job titles are valid at time of submissions and not necessarily current.
| Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry |
Advantest (Singapore) Pte. Ltd Sales & Marketing Department Yang Shang others
| GaN 8Gbps High-Speed Relay MMIC for Automated Test Equipment |
Advantest Laboratories Co., Ltd. Satoshi Koyama others
| The development of front-end module for 5G millimeter-wave device testing |
MMW R&D Section, 9th R&D Department, Technology Development Division, Technology Development Group, ATE Business Group Takahiro Kudo others