No.47 (Jan, 2017)
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* Author positions and job titles are valid at time of submissions and not necessarily current.
Technical Paper
| Title/Author |
|---|
| Known-Good-Die Test Methods for Large, Thin, High-Power Digital Devices Advantest, Inc. San Jose, CA, USA Dave Armstrong others |
| Modeling of contact resistance at very small contact point Advantest Laboratories Ltd. Takeshi Tanaka others |
Application
| Title/Author |
|---|
| ADC Linearity Measurement by Using Servo Method on the EVA100 ASD Test & Measurement System Business Group ASD Measurement System R&D Department Application R&D Section Hiroaki Kato |
| High Speed and high precision ADC tests using the High Frequency AWG/DGT module of the EVA100 test system Technology Development Group 9th R&D Department Yasuhide Kuramochi other |
| High-Density LSI Failure Analysis Technology using an Ultra-High Resolution TDR System Terahertz System Business Division System R&D Department System R&D Section Masaichi Hashimoto other |