網站內容顯示 網站內容顯示

Please first register using the below form to view the online Probo articles.

* Author positions and job titles are valid at time of submissions and not necessarily current.

Technical Paper

Title/Author
High-resolution Time-domain Reflectometry Analysis in Back-end-of-line (BEOL) by Recursive Circuit Modelling
Advantest (Singapore) Pte .Ltd. Marketing & New Product Department Yang Shang others

Technical Description

Title/Author
Development of high-voltage, high-current floating module with a maximum of 320 V and 18 channels
Business Promotion Group Technology Development Division 8th R&D Department DC R&D Section 1 Shigeyuki Takeda others

Application

Title/Author
Test cell solution for reducing thermal spikes in semiconductor device testing
Sales Group System Solution Division 2nd SoC System Engineering SoC SE3 Takatoshi Yoshino others
Verizon 5G: Test challenges for next generation of mmWave communications using V93000 WaveScale RF
Advantest America, Inc. Max Seminario others
Test Time Analysis & Optimization on SmarTest8
Advantest China Co., Ltd. ADVANTEST Business Development&Center of Expertise, Asia Zexin Yan others