網站內容顯示
- An account is required to view Probo. Please register via the "Sign Up" link on the authentication page.
- If you already have an account, please log in via the "Log In" link on the authentication page.
* Author positions and job titles are valid at time of submissions and not necessarily current.
Technical Paper
| Title/Author |
|---|
| Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry Advantest (Singapore) Pte. Ltd Sales & Marketing Department Yang Shang others |
| GaN 8Gbps High-Speed Relay MMIC for Automated Test Equipment Advantest Laboratories Co., Ltd. Satoshi Koyama others |
Technical Description
| Title/Author |
|---|
| The development of front-end module for 5G millimeter-wave device testing MMW R&D Section, 9th R&D Department, Technology Development Division, Technology Development Group, ATE Business Group Takahiro Kudo others |
Application
| Title/Author |
|---|
| Development / mass production TAT shortening method through emulation of image sensor device CIS Section, T2000 SE Department, System Solution Division, Sales Group Takehisa Yoda others |