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Title/Author
Electro-optic and dielectric characterization of ferroelectric films for high-speed optical waveguide modulators Advantest Laboratories Co.,Ltd.　Shin Masuda and others
Real-Time Testing Method for 16 Gbps 4-PAM Signal Interface ATE Unit Development Group 5th R&D Department FT Technology R&D Section 2 Masahiro Ishida and others

Title/Author
Analysis Case Using Cross Domain AnalyzerTM RF Measuring Unit Business DivisionDevelopment Department, 1st Development Minoru Iida and others

Title/Author
Visualization of Handler statistics data - The Way of user-oriented GUI - FA Product Development Department HS Development Section 1 Yuichi Nansai
Dedicated Nand Flash Memory Tester Technology With New Concept ATE System Development Group 8th R&D Department Masahiko Yamabe
Development of an ATE Test Cell for At-Speed Characterization and Production Testing Advantest Europe GmbH José Moreira