Test Technology Library Test Technology Library

Learn from Advantest experts about the latest industry trends, challenges, methodologies, and our products.

Access over 60 technical papers, and be notified by email as new papers are added. Don't miss out on keeping up to date with the newest technical trends!

NOTE

To access the Test Technology Library papers, you MUST be registered and logged in.
Register and start learning today!

Please review the Terms and Conditions for downloading papers from the Test Technology Library.

Sample Papers (no login required)

• Parallel Test Reduces Cost of Test More Effectively Than Just A Cheap Tester
• Enabling the PCI ExpressTM ramp – ATE based testing of PCI Express architecture
• Practical design methodologies that enable concurrent testability of multiple analog and digital modules in SOC devices and provide significant reusability of ATE test vectors
• Integrated Cellular Transceivers: Challenging Traditional Test Philosophies