| Title | No. |
| Development of control system “HC-X” for inteXcell(MC5041) | No.60 |
| 16 Gbaud PAM3 V93000 BOST solution for GDDR7 | No.59 |
| The development of front-end module for 5G millimeter-wave device testing | No.58 |
| High-speed Image Processing by GPU | No.56 |
| Development of an Air-Cooling Active Thermal Control Function for M4841 | No.55 |
| Development of a CMOS Image Sensor Capture Module for MIPI D-PHY/C-PHY | No.55 |
| Mass Production Program Automatic Optimization | No.54 |
| Development of high-voltage, high-current floating module with a maximum of 320 V and 18 channels | No.52 |
| The elemental technologies for multi-site test of RF IC by V93000 | No.48 |
| Why Next-Generation NAND Flash Requires a Dedicated Test Solution | No.42 |
| Test technology of CMOS image sensor device | No.41 |
| Development of termination voltage amplifier for 10Gbps CML PE-Driver | No.39 |
| Development of wide band range, High-density and High-speed Transmission Connector for HIFIX | No.39 |
| Low COT Tester Technology for Memory Core Testing | No.39 |
| Visualization of Handler statistics data - The Way of user-oriented GUI - | No.38 |
| Dedicated Nand Flash Memory Tester Technology With New Concept | No.38 |
| Development of an ATE Test Cell for At-Speed Characterization and Production Testing | No.38 |
Technical Description