Application Application

Title No.
Development / mass production TAT shortening method through emulation of image sensor device No.58
An MCU+Wi-Fi (802.11n) EVM measurement method with correction of IQ skew imbalance No.57
Generation of C-PHY signals and UI jitter with 8GDM No.55
Mass production technology of MEMS sensor with ATE No.53
Test cell solution for reducing thermal spikes in semiconductor device testing No.52
Verizon 5G: Test challenges for next generation of mmWave communications using V93000 WaveScale RF No.52
Test Time Analysis & Optimization on SmarTest8 No.52
New Thermal Technology for a New Burn-in Test System No.51
T2000 IPS + GPWGD: a Measurement Technique with Ultra-High Dynamic Range for Hi-Res Audio No.51
A multiple simultaneous measurement technique for UHF tag RF I/F using a digital module No.50
Proposal for adjustment/inspection of current sensors using an EVA100 magnetism application system No.50
Jitter Measurement Using a V93000 Time Measurement Unit (TMU) and Taking into Account the Jitter Transfer Function No.49
High accuracy EPE measurement & Lithography Simulation capability for ILT mask No.49
M4871/72 temperature control solution for High-Power Device No.48
ADC Linearity Measurement by Using Servo Method on the EVA100 No.47
High Speed and high precision ADC tests using the High Frequency AWG/DGT module of the EVA100 test system No.47
High-Density LSI Failure Analysis Technology using an Ultra-High Resolution TDR System No.47
Method of device power regulation by PRM™ (Power Regulation Module) No.46
High speed Linearity Measurement for 14bit ADC by High Speed Linear Ramp generator on EVA100 No.46
Development of high accuracy vision alignment function for the test handler No.45
Test Program Generation Environment for Analog Device Test on T2000. No.45
Embodiment of Efficient Test Program Development Environment in T2000 No.44
Development of Device Interface and Probe Card for Image Sensor Tests to achieve 3Gbps Data Transmission No.44
High-precision measurement technology for the terahertz wave power No.43
Multi-Domain Test - A New Test Strategy to Reduce the Cost of Test No.41
Tablet coating evaluation technique and analysis examples in the pharmaceutical industry using terahertz wave No.41
ECOTsTM the Evolutionary Factory Automation tool No.40
High Efficiency Massive Parallel Test Capability of T2000 Integrated Massive Parallel test solution No.40
Test technology of IGBT on T2000 No.39
The performance of T5511 Timing-Training hardware No.39
Test Technology Enabling Multiple-Device Parallel Testing of Motion Sensors No.39
Analysis Case Using Cross Domain AnalyzerTM No.38